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Inner ear ultrastructure in a high voltage electron microscope Tomonori Takasaka 1 1Department of Otolaryngology, Tohoku University school of Medicine pp.777-791
Published Date 1981/8/10
DOI https://doi.org/10.11477/mf.1431905310
  • Abstract
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 Applications of high voltage electron microscope (HVEM) were studied in biology specimens. The main advantage of HVEM is that sharp images of thicker specimens can be obtained because of the greater penetrating power of high energy electrons. The optimum thickness of the sections examined with an accelerating voltage of 1,000 kV was found to be between 500 nm to 800 nm. In this report, the thick sections of the sensory hairs and their rootlets were examined in JEM-1000 and three-dimensional reconstructions of efferent and afferent nerve endings on each hair cell were made at various sites in the cochlea.


Copyright © 1981, Igaku-Shoin Ltd. All rights reserved.

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電子版ISSN 1882-1243 印刷版ISSN 0001-8724 医学書院

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